Try Our New BETA Version
GO
(navigation image)
Home American Libraries | Canadian Libraries | Universal Library | Community Texts | Project Gutenberg | Children's Library | Biodiversity Heritage Library | Additional Collections
Search: Advanced Search
Anonymous User (login or join us)
Upload

View the book

item image

(~50 pg)Read Online
(2.7 M)PDF
(518.4 K)EPUB
(~50 pg)Kindle
(~50 pg)Daisy
(56.5 K)Full Text
(1.4 M)DjVu


All Files: HTTPS Torrent (2/0)

Help reading texts

Resources

Bookmark

Scanning electron probe microanalysis. (1967)



fullscreen
Author: Heinrich, Kurt F. J.
Volume: NBS Technical Note 278
Year: 1967
Possible copyright status: NBS/NIST Technical Notes are a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. However, please pay special attention to the individual works to make sure there are no copyright restrictions indicated. Individual works may require securing other permissions from the original copyright holder.
Language: English
Call number: QC100 .U5753 no.278
Digitizing sponsor: NIST Research Library
Book contributor: NIST Research Library
Collection: NISTTechNotes; NISTresearchlibrary; fedlink; americana
Notes: No copyright page found. No table-of-contents pages found.

Description

The combination of electron microprobe x-ray emission spectrometry with the scanning techniques first developed for the scanning electron microscope permits using the scanning electron probe as a microscope sensitive to elemental composition. This techni


Be the first to write a review
Downloaded 206 times
Reviews

Selected metadata

Page-progression: lr
Scanningcenter: capitolhill
Mediatype: texts
Shiptracking: technical_notes_batch_3
Identifier-bib: nbstechnicalnote278
Identifier: scanningelectron278hein
Scanner: scribe11.capitolhill.archive.org
Ppi: 350
Camera: Canon EOS 5D Mark II
Operator: associate-annie-coates@...
Scandate: 20121211145752
Republisher: associate-phillip-gordon@...
Imagecount: 50
Identifier-access: http://archive.org/details/scanningelectron278hein
Identifier-ark: ark:/13960/t56d7501c
Ocr: ABBYY FineReader 8.0
Sponsordate: 20121231

Terms of Use (31 Dec 2014)